ELPHOS LABORATORIES and FACILITIES

Elphos laboratories have been developed integrating the modern ultrafast laser sources with angle-resolved photoemission experiments and with the traditional optical spectroscopic techniques. We are currently able to investigate the non-equilibrium electron dynamics in solid-state systems through time-resolved photoemission and to perform high resolution time- and frequency-resolved optical spectroscopies to study the ultrafast electron dynamics in high-Tc superconductors and strongly correlated systems.

Our facilities...

PHOTOEMISSION

  • UHV chamber equipped with:
    -  5 degrees of freedom cryogenic sample holder (minimum
       temperature: 30 K)
    -  Time of Flight spectrometer (en. resolution: 15 meV@ 2 eV kin. en.)
    -  Low Energy Electron Diffraction
    -  Ion-gun for sample preparation
    -  Preparation chamber for sample evaporation

  • UHV chamber equipped with:
    -  Hemispherical electron analyzer
    -  Preparation chamber for sample evaporation
    -  Electromagnets for magneto-optical measurements






OPTICS

  • Amplified Ti:sapphire oscillator
    -  800 nm wavelength
    -  150 fs pulse duration
    -  1 kHz rep. rate, 1 W output power

  • Collinear optical parametric amplifier
    of super-fluorescence
    -  1250-2200 nm wavelength tunability
    -  150 fs pulse duration

  • Non-collinear optical parametric amplifier
    of white-light continuum
    -  425-750 nm wavelength tunability
    -  30 fs pulse duration

  • Cavity dumped Ti:sapphire oscillator
    -  700-950 nm wavelength tunability
    -  120 fs pulse duration
    -  Rep. rate tunable from 1.8 MHz to single shot
    -  60 nJ/pulse energy

  • White-light continuum generation through photonic fiber
    -  450-1600 nm wavelength tunability
    -  pulse characterization
    -  high-speed array detection for simultaneous
        time and frequency resolution

  • Optical spectrum analyzer
    -  350-1750 nm wavelength range
    -  0.05 nm maximum resolution
    -  -75-20 dBm measurement level range

OTHER EQUIPMENTS

  • Time-resolved magneto-optics
    -  Double lock-in configuration
    -  50 kHz Photoelastic modulator

  • Electromagnet
    -  1.2 T maximum magnetic field

  • Cryogenic sample holder
    -  4.5 K minimum temperature
    -  Reflectivity and transmissivity measurement configurations




MICROSCOPY

  • Atomic Force Microscopy
    -  1 AFM microscope operating in the frequency modulation
       mode (FM-AFM)
    -  1 AFM microscope operating in the amplitude
       modulation mode (AM-AFM).

  • Scanning-probe Near-field Optical Microscopy
    -  1 SNOM, working simultaneously in collection mode,
       reflection mode and transmission mode.